CONTEXT

Information storage and more specifically non-volatile memories represent strategic issues in the field of microelectronics. The huge non-volatile memory market is currently led by the Flash technology (Flash cards, Solid State Drives). However, the intrinsic drawbacks of this technology (long writing time, 5-10 μs, use of high voltages, 5-10 V and complex design) will limit its development in the near future. Several alternatives, such as the Phase Change (PCRAM), Magnetic (MRAM) or Resistive (RERAM) Random Access Memories, are currently considered to overcome the main limitations of the Flash technology. In particular, RRAM’s, based on an Electric-Pulse-Induced Resistive Switching (EPIRS) effect, seem to be an appealing solution as they offer a better scalability, shorter writing times (10-100 ns) and a good endurance.