|
METHOD AND DEVICE FOR HIGH-SPEED INTERFERENTIAL MICROSCOPIC IMAGING OF AN OBJECT |
|
Principal Investigator: A. DUBOIS
|
TECHNICAL DESCRIPTION
This invention describes a method and a device for the interferential microscopic imaging of an object by sending a light beam to each of the arms of a two-wave interferometer, with the object to be analyzed in one of the arms. The phase is subject to a sinusoidal modulation to a frequency f.
Signal modulation is a result of mechanical oscillation of an assembly of elements of the interferometer. The interference signal is integrated during the phase variation by a multichannel sensor. A computer records the integrated interference signal obtained during each period fraction 1/n and calculates the image of the object. The invention is potentially useful for characterizing thin layers, for controlling components in microelectronics, for reading data stored in volumes (3D) and unstable objects in biology and in vivo studies.
To read more, please register or connect in the right pannel... |
