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INTEGRATED TESTING DEVICE FOR A D CONVERTERS |
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Principal Investigator: M. RENOVELL
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TECHNICAL DESCRIPTION
The present invention describes the integration of a self-test module to measure the functional characteristics of a converter, for example shift, gain, non-linearity and others, using the histogram test principle. To reduce the amount of information to be stocked on the chip, the inventors broke down histogram accumulation and exploitation. In this way, test integration using the histogram is profitable because the necessary resources are scaled down while the performance is equivalent.
A prototype was built in AMS 0.8 mm technology. The necessary surface is only 0.15 mm2 for an 8 bit ANC (compared to 2 mm2 usually). The added surface represents less than 8% of the total surface of the converter. The integration of this structure is inexpensive compared to the possibility of testing all the characteristics of the ANC.
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